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Diffractometer for Element-Specific Analysis on Local Structures Using a Combination of X-ray Fluorescence Holography and Anomalous X-ray Scattering

Hiroo Tajiri,Shinji Kohara,Koji Kimura, Sekhar Halubai, Haruto Morimoto,Naohisa Happo,Jens R Stellhorn,Yohei Onodera, Xvsheng Qiao,Daisuke Urushihara,Peidong Hu,Toru Wakihara,Toyohiko Kinoshita,Koichi Hayashi

Journal of synchrotron radiation（2025）

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关键词
x-ray diffractometers,x-ray fluorescence holography,anomalous x-ray scattering,element-specific measurements,carry-in equipment
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