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Residue-free Layered Material Interfaces for Device Processing

Subrata Paul,Bikash Das,Arunava Kar, Shuvankar Das,Smruti Ranjan Mohanty,Kenji Watanabe,Takashi Taniguchi,Subhadeep Datta,Krishnakumar S. R. Menon

APPLIED SURFACE SCIENCE（2025）

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Key words
2D materials,Low-energy electron microscopy (LEEM),Polymer residues,Raman spectroscopy,Atomic force microscopy (AFM),Hexagonal boron nitride (h-BN)
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