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Boosting Mutation-Based Fault Localization by Effectively Generating Higher-Order Mutants

Shumei Wu, Binbin Yang, Zexing Chang,Zheng Li,Xiang Chen,Yong Liu

INFORMATION AND SOFTWARE TECHNOLOGY(2025)

Cited 0|Views2
Key words
Fault localization,Multiple-fault scenarios,Mutation-based fault localization,High-order mutant generation
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