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Landau-Levich Scaling for Optimization of Quantum Dot Layer Morphology and Thickness in Quantum-Dot Light-Emitting Diodes.

Yiman Xu, Grant J. Dixon, Qing Xie, James F. Gilchrist,Brandi M. Cossairt,David S. Ginger,Elsa Reichmanis

ACS NANO(2025)

Cited 0|Views3
Key words
QLED,blade coating,low-waste,morphology,thickness control
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