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A Cross-scale Investigation on Transient Electrothermal Performance for Power MOSFETs at Device-Package Level

Yuxuan Dai,Jiafei Yao,Jing Chen, Maolin Zhang, Yucheng Xu,Qing Yao, Qingyou Qian,Jun Zhang,Kemeng Yang,Yufeng Guo

Microelectron J(2025)

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关键词
— automated device-package-level simulation,power MOSFETs,transient electrothermal performance,time constant
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