Model-based Deep Unrolling Framework for Electrical Impedance Tomography Image Reconstruction
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT（2025）
Key words
Image reconstruction,Electrical impedance tomography,Imaging,Inverse problems,Data models,Iterative algorithms,Training,Optimization,Numerical models,Biomedical measurement,Convolutional neural network,deep unrolling network (DUN),electrical impedance tomography (EIT),inverse problem,iterative shrinkage/thresholding algorithm (ISTA)-based method
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