Prototype of Hi’Beam-SEE: A Real-time High-resolution Single Event Effects Locating Device for Heavy Ion Facilities
IEEE Transactions on Nuclear Science(2025)
Institute of Modern Physics | Liaoning Academy of Materials | School of Physical Science and Technology
Abstract
Integrated circuits (ICs) are widely used in spacecraft and are concerned with the probability of Single Event Effects (SEEs). To accurately locate the SEE-sensitive area of ICs, we have designed Hi’Beam-SEE for the single event effect experiment terminal at heavy-ion facilities. The Hi’Beam-SEE consists of three sub-systems: the heavy ion positioning system is responsible for locating the position of each particle within the beam, the single event detection system detects the SEEs that occurred in the device under test, and the online tracking algorithm extracts and reconstructs the position of each particle that triggers SEEs. The beam test with 84Kr18+ particles demonstrates the heavy ion positioning system can achieve a spatial resolution of 4 μm in measuring every single particle’s position. Also, the single event detection system can identify SEEs correctly and issue triggers with good timing accuracy. The online tracking algorithm can process 172 frames that contain tracks per second and extract the positions with an accuracy of 3.2 μm. In addition, it attains a rejection factor of 93.6% while keeping the signal efficiency of 99%. This paper will discuss the design and performance characterization of the Hi’Beam-SEE.
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Key words
Integrated circuits,neural network,readout electronics,single event effect,silicon pixel sensor
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