Mapping Stress/Strain in Nanoscale FinFETs: Implications for Device Design
2024 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)（2024）
关键词
Stress,Strain,3D-FinFET,Device Design
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要