Ballistic Transport in State-of-the Art In0.65Ga0.35As/In0.52Al0.48As Quantum-Well High-Electron-Mobility Transistors at Room and Cryogenic Temperatures
2024 IEEE International Electron Devices Meeting (IEDM)(2024)
Key words
Cryogenic Temperatures,High Electron Mobility Transistors,Ballistic Transport,Carrier Transport,Channel Layer,Role Of Mobility,Gate Length,Isothermal,Technological Devices,Effective Mobility,Gate Capacitance
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