Fine Characterization and Modeling of the Frequency Dependence of TDDB in RF Domain (F>10ghz)
2024 IEEE International Electron Devices Meeting (IEDM)（2024）
Key words
Frequency Dependence,Time-dependent Dielectric Breakdown,RF Domain,Power-law,Sine Wave,Dielectric Relaxation,Duty Factor,Dielectric Constant,Local Field,Test Setup,Cumulative Time,Gate Current,Percolation Model,Digital Operations
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