Statistics Based Modeling and Analysis of Ultra-Low Impedance Carbon Nanotube MOS Capacitors

Matthias Passlack,Nathaniel Safron, Aaryan Oberoi,Carlo Gilardi, Jack Zuo,Sheng-Kai Su,Tzu-Ang Chao,Amin Azizi,Shreyam Natani,Gilad Zeevi,Prabhakar Bandaru,Andrew Kummel,H.-S. Philip Wong,Gregory Pitner,Iuliana Radu

2024 IEEE International Electron Devices Meeting (IEDM)（2024）

Cited 0|Views4

Key words

Optimization Process,I-V Curves,Impedance Analysis,Impedance Data,Impedance Model,Band Gap,Positive Bias,Carrier Density,Gate Dielectric,Small Circuit,Carbon Nanotubes Network

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined