On the Origin of Holes During Polarization Reset in Floating Body Ferroelectric FETs Towards Improving Switching Efficiency

Zhouhang Jiang,Yi Xiao, Milind Weling,Halid Mulaosmanovic,Stefan Duenkel,Dominik Kleimaier,Steven Soss,Sven Beyer,Rajiv Joshi, Mohamed,Scott Meninger,Xiao Gong,Vijaykrishnan Narayanan,Kai Ni

2024 IEEE International Electron Devices Meeting (IEDM)（2024）

引用 0|浏览3

关键词

Origin Of Holes,Voltage Drop,Drain Bias,Generation Of Holes,Low Voltage,Pulse Width,Switching Dynamics,Polarization Switching,Compact Model,Static Voltage,Low Threshold Voltage,Memory Window,Reset Process,TCAD Simulation,Reset Voltage,Polar Set

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要