On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments
arxiv（2025）
Key words
Radiation effects,power transistor,UMOSFET,trench MOSFET,DMOSFET,atmospheric neutrons,single-event effect,single-event burnout,single-event gate rupture
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined