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Microstructure Damage for Single-Event Leakage Current II in SiC MOSFETs Induced by Heavy Ion

Leshan Qiu,Yun Bai,Jieqin Ding, Zewei Dong,Chengyue Yang,Yidan Tang,Xiaoli Tian,Xinyu Liu

IEEE Transactions on Electron Devices（2025）

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Key words
Heavy-ion irradiation,microstructure damage,MOSFETs,p-i-n diodes,silicon carbide (SiC),single-event leakage current (SELC)
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