Development of More Robust and Stable Logic Gates Using Novel Parameter Values for SiDB
Latin American Symposium on Circuits and Systems（2025）
关键词
Dielectric Constant,Physical Limitations,Circuit Design,Compact Design,Boolean Function,High-density Integration,Negatively Charged,Building Blocks,Analysis Of Values,Fast Decay,Complex Circuits,Fundamental Building Block,Truth Table,Set Of Libraries,OR Gate,NOT Gate,Binary Ones
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