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Terminal Passivation–Induced Interface Decoupling for High‐Stability Two‐Dimensional Semiconductors

Jinbo He, Jinjian Yan,Tao Xue, Liqian Yuan,Yongxu Hu, Zhongwu Wang,Xiaosong Chen, Yinan Huang,Cheng Han,Liqiang Li,Wenping Hu

SmartMat（2025）

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Key words
2D materials,high temperature,interface decoupling,stability,terminal passivation,transistors
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