On the Origin of Temperature Induced Performance Degradation of Cu-Contacted Mg2X-Based (X = Si, Sn) Thermoelectric Materials.

Radhika Deshpande,Amin Bahrami, Frederic Kreps, Ran He, Pingjun Ying,Kornelius Nielsch, Eckhard Müller,Johannes de Boor

ACS applied materials & interfaces（2025）

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