Further Characterisation of Digital Pixel Test Structures Implemented in a 65 Nm CMOS Process
Gianluca Aglieri Rinella, Nicole Apadula,Anton Andronic, Matias Antonelli, Mauro Aresti, Roberto Baccomi, Pascal Becht,Stefania Beole, Marcello Borri, Justus Braach, Matthew Daniel Buckland,Eric Buschmann, Paolo Camerini, Francesca Carnesecchi,Leonardo Cecconi,Edoardo Charbon,Giacomo Contin,Dominik Dannheim, Joao de Melo, Wenjing Deng, Antonello di Mauro, Jan Hasenbichler,Hartmut Hillemanns, Geun Hee Hong, Artem Isakov, Hangil Jang, Antoine Junique,Minjung Kim, Alex Kluge, Artem Kotliarov,Filip Křížek,Lukas Lautner, Sanghoon Lim,Magnus Mager, Davide Marras,Paolo Martinengo, Silvia Masciocchi, Marius Wilm Menzel, Magdalena Munker,Francesco Piro,Alexandre Rachevski,Karoliina Rebane,Felix Reidt, Roberto Russo, Isabella Sanna, Valerio Sarritzu,Serhiy Senyukov, Walter Snoeys,Jory Sonneveld,Miljenko Šuljić, Peter Svihra, Nicolas Tiltmann, Vittorio Di Trapani, Gianluca Usai, Jacob Bastiaan Van Beelen, Mirella Dimitrova Vassilev, Caterina Vernieri, Anna Villani arxiv（2025）
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