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Defect Recognition in Composite Materials Using Terahertz Spectral Imaging with ResNet18-SVM Approach

Zhongmin Wang, Jiaojie Chen, Yilong Xin, Yongbin Guo, Yizhang Li, Huanyu Sun,Xiuwei Yang

Materials (Basel, Switzerland)(2025)

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Key words
terahertz wave,ResNet18,SVM,deep learning,nondestructive testing
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