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First Study of Single-Event Burnout in Very-Thin Planar Silicon Sensors

Marco Ferrero,Roberta Arcidiacono,Nicolò Cartiglia, Leonardo Lanteri,Luca Menzio,Arianna Morozzi,Francesco Moscatelli, Roberto Mulargia, Federico Siviero, Robert White,Valentina Sola

Frontiers in Physics（2025）

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Key words
single-event burnout,SEB,thin silicon sensors,PiN,LGAD
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