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A Guide for Nanomechanical Characterization of Soft Matter Via AFM: from Mode Selection to Data Reporting

Eunyoung Kim, Alexandra L Ramos Figueroa,Max Schrock, Elizabeth Zhang, Christina J Newcomb,Zhenan Bao, Lukas Michalek

STAR protocols（2025）

引用 0|浏览4
关键词
Atomic Force Microscopy (AFM),Chemistry,Material sciences,Physics
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