Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current

Mor M. Dahan,Emanuel Ber, Florian Wunderwald, Gilad Zilberman, Guy Orlev, Yair Keller, Einav Raveh, Ruben Alcala,Thomas Mikolajick,Uwe Schroeder,Eilam Yalon

2025 IEEE International Memory Workshop (IMW)（2025）

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关键词

FeRAM,HZO,In-memory computing,Nonvolatile memory,Back-end-of-line compatibility,Non-destructive readout,endurance

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