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Boosting Stochasticity in Ovonic Threshold Switches Through Cryogenic First Firing for Fast and Reliable Entropy Generation

Dongmin Kim,Jangseop Lee, Yoori Seo, Ohhyuk Kwon, Pendar Azaripour Masouleh, Jisung Lee,Joonhyun Kwon, Chul‐Heung Kim,Hyunsang Hwang

Advanced Electronic Materials(2025)

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Key words
cryptography,hardware security,ovonic threshold switching,stochastic,true random‐number generator
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