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A Radiation-Hardened Resistive Random Access Memory with High-Reliability Write and Read Scheme

Weiyi Cao, Yajiao Liu, Chenglong Sui,Anni Cao, Kexin Yao, Tingrui Ren,Xupeng Han,Liang Wang,Bi Wang,Yuanfu Zhao

2025 6th International Conference on Radiation Effects of Electronic Devices (ICREED)(2025)

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Key words
RRAM,write scheme,read scheme,state management,radiation hardening
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