Thin 3D: an Innovative Approach to Ultra-Thin Wafer-Level Active Device Transfer Technology with Optimized Material and Thermal Solution for 3D Ic
2025 IEEE 75th Electronic Components and Technology Conference (ECTC)(2025)
关键词
3D integration,ultra-thin active device transfer,layer transfer,wafer-to-wafer bonding,thermal dissipation,AIN
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要