Matching Behavior of Analog Fdsoi N-Mos-Transistors under Large Backgate Voltage Swing Operating Conditions
2013 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)（2013）
关键词
MOSFET,elemental semiconductors,silicon,silicon-on-insulator,Si,analog FDSOI nMOS-transistor,drain current variation,large backgate biasing variation,large backgate voltage swing operating condition,linear mode threshold voltage,matching behavior,saturation mode threshold voltage
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要