Single- and Multiple-Event Induced Upsets in ${\rm HfO}_2/{\rm Hf}$ 1T1R RRAM
IEEE Transactions on Nuclear Science（2014）
Key words
Cross section,heavy ion,Hf,HfO2,multiple event upset,RESET,resistive random access memory (RRAM),SET,single event upset,state change,two photo absorption,TPA
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined