Double-sided Row Hammer Effect in Sub-20 Nm DRAM: Physical Mechanism, Key Features and Mitigation
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS（2023）
Key words
Capacitive crosstalk,DRAM,process dependence,row hammer effect,trap-assisted electron migration
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined