SEU Performance of Schmitt-trigger-based Flip-Flops at the 22-Nm FD SOI Technology Node

Zongru Li,Christopher Elash,Chen Jin,Li Chen,Shi-Jie Wen,Rita Fung,Jiesi Xing,Shuting Shi,Zhi Wu Yang,Bharat L. Bhuva

MICROELECTRONICS RELIABILITY（2023）

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关键词

Flip-flop (FF),Fully depleted silicon on insulator (FD SOI),Heavy-Ion,Radiation hardening by design,Single event upset,Soft-error rate,Schmitt-trigger

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