An Ultra High-Endurance Memristor Using Back-End-of-line Amorphous SiCOmesh Kapur,Dongkai Guo,Jamie Reynolds,Daniel Newbrook,Yisong Han,Richard Beanland,Liudi Jiang,C. H. Kees de Groot,Ruomeng HuangSCIENTIFIC REPORTS（2024）引用 3|浏览4关键词Memristor,SiC,Back-end-of-line,PECVD,EnduranceAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
