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Interface Engineering of Underlayer of Chemically-Amplified EUV Photoresists to Enhance the Photolithographic Performance

Tao Wang, Changchang Zhuang, Guo Yang,Hanshen Xin,Lin Jiang,Jianhua Zhang

Materials Science and Engineering B(2024)

引用 2|浏览5
关键词
Surface energy,Adhesion,Collapse,Lithographic performance,Interface
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