Bias Temperature Instability Variation on SiON/Poly, HK/MG and Trigate ArchitecturesC. Prasad,M. Agostinelli,J. Hicks,S. Ramey,C. Auth,K. Mistry,S. Natarajan,P. Packan,I. Post,S. Bodapati, M. Giles, S. Gupta,S. Mudanai,K. KuhnWaikoloa, HI（2014）引用 42|浏览52关键词BTI,reliability,variation,Tri-gate,HK/MG,SiON/PolyAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
